CBIT16E01_CANDO3_Test5 4-Wire Interface+Test Circuits

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chip_id: CBIT16E01_CANDO5

Test circuits for CANDO optrode including 4-wire communication sub-system, non-volatile memory, and test structures for long-term reliability testing.

  • Related projects: CANDO

Technology: AMS 0.35μm 2P4M CMOS (H35B4S1) 

Silicon Area: 4mm × 3.75mm

Designers: Dorian Haci, Federico Mazza, Sara S. Ghoreishizadeh, Yan Liu, Timothy G. Constandinou

Tape-out: May 2016

Relevant Publications