2016 CANDO Neural Recording + Test Circuits (CBIT16E01_CANDO1)
N/A
chip_id: CBIT16E01_CANDO1
Test circuits for CANDO optrode including recording sub-system, and test structures for long-term reliability testing.
- Related projects: CANDO
Technology: AMS 0.35μm 2P4M CMOS (H35B4S1)
Silicon Area: 5mm × 3.75mm
Designers: Dorian Haci, Federico Mazza, Yan Liu, Timothy G. Constandinou
Tape-out: May 2016