CBIT16E01_CANDO3_Test1 Neural Recording+Test Circuits (Gen.2)

N/A

chip_id: CBIT16E01_CANDO1

Test circuits for CANDO optrode including recording sub-system, and test structures for long-term reliability testing.

  • Related projects: CANDO

Technology: AMS 0.35μm 2P4M CMOS (H35B4S1) 

Silicon Area: 5mm × 3.75mm

Designers: Dorian Haci, Federico Mazza, Yan Liu, Timothy G. Constandinou

Tape-out: May 2016